Mr. Zhang Xinsheng, Vice Director General of Science and Technology Dept. MII, Mr. Yu Shengduo and Mr. Ye Lin, Director and Vice Director of High Tech Development Division, and Mr. Xu Peng attended this seminar. Testing instrument providers, telecom operators and research institutions involved in this seminar include UT Starcom, Agilent, R&S, Tektronix, Seahigh Shanghai, Starpoint, Anritsu, Nethawk, ZCTT, Catapult, RADCOM, China Telecommunication Technology Labs, China WLLC Communication Lab, Morlab Laboratory, China Mobile, France Telecom, NTT DoCoMo, SKT etc.

Mr. Zhang Xinsheng said, test instruments play a key role in the development of wireless technology. It is hard to imagine any mature product without good test equipments. Zhang said MII wish to get more idea of the development in this area and contribution of each company. He also encouraged the attendees to express their ideas and expectations in their R&D.

Representatives from Datang Mobile and T3G briefly summarized demands in the TD-SCDMA test instruments. Mr. Sun Jiachen from Datang Mobile said protocol conformity, RF conformity and universal radio communications tester are key to TD-SCDMA test.

Mr. Cheng Jingbo from T3G business development Dept. said, lack of conformity tester is the main obstacle in joint debugging stage. He hoped such tester can be developed soon by tester providers.

Representatives from UT Starcom, R&S, Tektronix, ZCTT, Catapult and RADCOM introduced the progress in their R&D respectively, including TD-SCDMA testing terminal and network testing solutions. Seahigh Shanghai, Starpoint and Anritsu introduced their TD-SCDMA Frequency Sweep Receiver in Network Optimization, TD-SCDMA mobile test solution and TD-SCDMA network simulator respectively.

The seminar and the discussion was presided by Mr. Wei Ran, Deputy Director of RITT, MII and Director of MTnet Laboratory. In the Q&A section, topics like TD-SCDMA conformity test, universal radio communications tester, network testing and HSDPA testing, etc. were discussed. In addition, attendees also showed great interest in trends of TD-SCDMA testing instrument after TD-SCDMA commercialization.

Dr. Wang introduced Rohde & Schwarz and Shanghai Seahigh, the two new senior members of TD-SCDMA Forum. Mr. Zhang Xinseng granted TD-SCDMA Forum senior membership certificate to these two firms.

Finally, Dr. Wang expressed his gratitude to all the attendees on behalf of the Forum for their support. He said, nearly all important domestic and international test instrument manufacturers had participated this seminar. Topics they discussed include challenges they face today, demands of their customers and status of their R&D. These will benefit their future R&D and facilitate the TD-SCDMA commercialization. Wang added, we believe with our joint effort, TD-SCDMA will have a bright future.

Mr. Li Jian, Agilent Measurement System Division Manager