TD-LTE Testing Technology Seminar 2011 Held in Beijing

China Academy of Telecommunication Research of MIIT and TD Forum jointly held “TD-LTE Testing Technology Seminar 2011” on December 7th, 2011 in the Presidential Beijing. Mr. Yu Shengduo, Director of Hi-tech Department of Science and Technology Division, MIIT attended this conference and gave the keynote speech. Mr. Yu stressed the development of TD-SCDMA and the promotion of TD-LTE industry are interrelated. According to Mr. Yu, TD-SCDMA test initial stage is difficult. Today, with the fast development of technology, the means of testing are becoming richer day by day. He hoped test function could support R9 version and meet the performance verification test in the second phase of TD-LTE scale network trial.

On today‘s Seminar of 2011 TD-LTE Test Technology, Liu Duo, vice President of CATR, MIIT, said that the second phase of TD-LTE scale-trial will focus on multi-mode terminal. She also stressed that, "The global development opportunities of TD-LTE have emerged in 2012, and 2012 is still the critical period of TD-LTE development.

At the meeting, Mr. Wei Guiming and Ms. Zhao Lijun gave the keynote speech respectively. They put forward new requirements and ideas for the next step of TD-LTE test technology development from technology, industry development and service application development aspects.

Representatives from various research institutes and test instrument manufacturers including CATR of MIIT, China Mobile Research Institute, R&S, Angilent, IXIA, Anritsu, Anite, StarPoint, Aeroflex, Datang Mobile, Azimuth and ritt7Layers delivered speeches. More than 200 guests from over 50 enterprises attended this conference and discussed on TD-LTE test technology development status and future trend.

In 2011, TD-LTE scale network trial is going smoothly.TD-LTE technology has made significant progress in the standards, technical tests, industrialization and internationalization. Especially in TD-LTE scale network trial and industrialization process, test technology, as a necessary verification means of TD-LTE technology and product, has played an irreplaceable role in TD-LTE technology and product maturity and perfection. In this regard, as the co-organizers of this conference, Mr. Wei Ran, Vice Director of Institute of Communication Standards Research, MIIT and Mr. Shi Guang, the Secretary-General of TD Forum, expressed their appreciation to everyone who has engaged in this field for a long time. Mr. Shi hoped that test instrument and system manufacturers and other manufacturers of the industry chain could have the opportunity to communicate on TD-LTE test technology, test instrument, test tools, etc. to promote industry cooperation, push the smooth progress of TD-LTE technology experiments, further accelerate the comprehensive and orderly development of TD-LTE industry, and strive to make TD-LTE as the global competitive next-generation broadband wireless mobile communications industry.